Old Web
English
Sign In
Acemap
>
authorDetail
>
P. Bindzi
P. Bindzi
Scanning probe microscopy
Scanning confocal electron microscopy
Vibrational analysis with scanning probe microscopy
Optics
Scanning ion-conductance microscopy
2
Papers
14
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: development of a novel sample-holder.
2014
Review of Scientific Instruments
Fabien Cheynis
Frédéric Leroy
Alain Ranguis
B. Detailleur
P. Bindzi
C. Veit
W. Bon
P. Müller
Show All
Source
Cite
Save
Citations (11)
Deposition of gold nanofeatures on silicon samples by field-induced deposition using a scanning tunneling microscope
2005
Journal of Vacuum Science & Technology B
H. Abed
H. Jamgotchian
H. Dallaporta
B. Gely
P. Bindzi
D. Chatain
S. Nitsche
D. Chaudanson
E. Cambril
V. Safarov
D. Tonneau
Show All
Source
Cite
Save
Citations (3)
1
map