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Jae Gyung Ahn
Jae Gyung Ahn
Integrated Device Technology
Salicide
Leakage (electronics)
Isotropic etching
Ion implantation
Etching
2
Papers
4
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0
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Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation.
2022
IRPS | International Reliability Physics Symposium
Jae Gyung Ahn
Jim Wesselkamper
Jonathan Chang
Jennifer Wong
Xin Wu
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N/sup +//P junction leakage characteristics of Co salicide process for 0.15 /spl mu/m CMOS devices
2002
IEEE Transactions on Electron Devices
Key-Min Lee
Chel-Jong Choi
Joo Hyoung Lee
Tae Yeon Seong
Young-Jin Park
Sung Kwon Hong
Jae Gyung Ahn
Hi-Deok Lee
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Citations (4)
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