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S Kaarlela
S Kaarlela
Electron beam-induced current
Optoelectronics
Wafer
Materials science
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Characterization of denuded zones in internally gettered silicon wafers by electron beam induced current measurements
2018
Antti Haarahiltunen
Hele Väinölä
Marko Yli-Koski
R. Ruotsalainen
Eero Saarnilehto
S Kaarlela
E Haimi
J. Sinkkonen
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