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Jae-Kue Nho
Jae-Kue Nho
Electromigration
Tungsten
Hardness
Semiconductor
Diffusion barrier
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Characteristics of Electomigration & Surface Hardness about Tungsten-Carbon-Nitrogen(W-C-N) Related Diffusion Barrier
2009
Soo In Kim
Young-Joo Hwang
Dong-Shik Ham
Jae-Kue Nho
Jae-yun Lee
Jun Park
Chan-Goen Ahn
Chang-Seong Kim
Chan-Woo Oh
Kyeng-Hwan Yoo
Chang-Woo Lee
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