Old Web
English
Sign In
Acemap
>
authorDetail
>
Yuki Ikiri
Yuki Ikiri
University of Tokushima
Electronic engineering
Boundary scan
Flip
Spice
Materials science
6
Papers
3
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (6)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Open Defect Detection in Assembled Circuit Boards with Built-In Relaxation Oscillators
2021
IEEE Transactions on Components, Packaging and Manufacturing Technology
Yuki Ikiri
Fumiya Sako
Masaki Hashizume
Hiroyuki Yotsuyanagi
Shyue-Kung Lu
Toru Yazaki
Yasuhiro Ikeda
Yutaka Uematsu
Show All
Source
Cite
Save
Citations (0)
Temperature Sensing with a Relaxation Oscillator in CMOS ICs
2020
Fumiya Sako
Yuki Ikiri
Masaki Hashizume
Hiroyuki Yotsuyanagi
Hiroshi Yokoyama
Shyue-Kung Lu
Show All
Source
Cite
Save
Citations (0)
Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops
2016
ICSJ | CPMT Symposium Japan
Fara Ashikin Ali
Masaki Hashizume
Yuki Ikiri
Hiroyuki Yotsuyanagi
Shyue-Kung Lu
Show All
Source
Cite
Save
Citations (0)
Electrical Interconnect Test of Solder Joint Part with Boundary Scan Flip Flops and a Built-in Test Circuit
2016
Journal of Japan Institute of Electronics Packaging
Masaki Hashizume
Yuki Ikiri
Tomoaki Konishi
Hiroyuki Yotsuyanagi
Shyue-Kung Lu
Show All
Source
Cite
Save
Citations (2)
Repair Circuit of TSVs in a 3D Stacked Memory IC
2015
Yuki Ikiri
Masaki Hashizume
Hiroyuki Yotsuyanagi
Hiroshi Yokoyama
Tetsuo Tada
Shyue-Kung Lu
Show All
Source
Cite
Save
Citations (0)
Electrical interconnect test method of 3D ICs without boundary scan flip flops
2015
ICSJ | CPMT Symposium Japan
Masaki Hashizume
Shoichi Umezu
Yuki Ikiri
Fara Ashikin Ali
Hiroyuki Yotsuyanagi
Shyue-Kung Lu
Show All
Source
Cite
Save
Citations (1)
1
map