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Young-Joo Hwang
Young-Joo Hwang
Amorphous solid
Scanning electron microscope
Critical point (thermodynamics)
Analytical chemistry
Vanadium oxide
2
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34
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Characteristics of Electomigration & Surface Hardness about Tungsten-Carbon-Nitrogen(W-C-N) Related Diffusion Barrier
2009
Soo In Kim
Young-Joo Hwang
Dong-Shik Ham
Jae-Kue Nho
Jae-yun Lee
Jun Park
Chan-Goen Ahn
Chang-Seong Kim
Chan-Woo Oh
Kyeng-Hwan Yoo
Chang-Woo Lee
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Citations (2)
Phase and structural characterization of vanadium oxide films grown on amorphous SiO2/Si substrates
2004
Journal of Vacuum Science and Technology
Doo-Hyeb Youn
Hyun-Tak Kim
Byung-Gue Chae
Young-Joo Hwang
Ju Wook Lee
Sunglyul Maeng
Kwang Yong Kang
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Citations (32)
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