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M. Richter
- German National Metrology Institute
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128
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4312
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- Sanghoon Song
- Roberto Alonso-Mori
- Matthieu Chollet
- Yiping Feng
- J. M. Glownia
- H. Lemke
- Marcin Sikorski
- Diling Zhu
- Stefan Moeller
- Hae Ja Lee
- Mark S. Hunter
- Gabriella Carini
- K. Tiedtke
- U. Jastrow
- Andrey Sorokin
- M. Richter
- Shigeki Owada
- Kensuke Tono
- Norio Saito
- Takahiro Tanaka
- Masahiro Kato
- Makina Yabashi
- Aymeric Robert
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Citations (3) -
- Sanghoon Song
- Roberto Alonso-Mori
- Matthieu Chollet
- Yiping Feng
- James M. Glownia
- Henrik T. Lemke
- Marcin Sikorski
- Diling Zhu
- Stefan Moeller
- Hae Ja Lee
- Mark S. Hunter
- Gabriella Carini
- K. Tiedtke
- U. Jastrow
- Andrey Sorokin
- M. Richter
- Shigeki Owada
- Kensuke Tono
- Norio Saito
- Takahiro Tanaka
- Masahiro Kato
- Makina Yabashi
- Aymeric Robert
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2018 Metrologia
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2017 Applied OpticsShow All
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2016 NanotechnologyShow All
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