Use of electrical stress and isochronal annealing on power MOSFETs in order to characterize the effects of 60 Co irradiation

Abstract Fowler-Nordheim injection and isochronal anneals for several power MUM of various manufacturers made it possible to highlight that characteristic charge trap temperatures were identical to those due to radiation with 60 Co source. Results allow us to put forward some assumptions about electrical stress use as a selection component method for radiation environment.