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Electrical characterization of nanowires combined with in-situ TEM imaging
Electrical characterization of nanowires combined with in-situ TEM imaging
2019
Sardar Bilal Alam
Christopher Røhl Andersen
F. Panciera
Ole Hansen
Frances M. Ross
Nika Akopian
Kimberly Dick Thelander
Kristian Mølhave
Keywords:
Nanotechnology
Microelectromechanical systems
Nanowire
Materials science
In situ
Correction
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