Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics.
2018
Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as focal plane devices for X-ray space-borne missions but, when coupled to large-area concentrator
X-ray optics, these detectors are affected by strong pile-up and
dead-timeeffects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current
technological gapin the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughput
X-ray astronomyapplications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated
silicon drift detectorwhich operates in the energy range 0.5-15 keV with nearly Fano-limited energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (4$\times$4) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive
preamplifiers(SIRIO) and we discuss the future PixDD prototype developments.
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