Dressed topological edge states in HgTe-based 2D topological insulators
2019
Enormous efforts are focused on the edge states of two-dimensional topological insulators currently, motivated by exotic fundamental physics, robust topological quantum computation and novel spinorbitronics. Progress is however largely impeded by the fragility of the edge states visible only on short lengths. In this context, microwave transport allows us to capacitively probe the density of states of HgTe topological insulators while measuring simultaneously the device resistance. Besides bulk states, the dynamical transport highlights the response of the edges, which host very mobile carriers, but are also much denser than theoretically expected. We propose a scenario of 'dressed' topological edge states, with topological edge carriers coupled to neighboring confined bulk states. These additional states thus contribute to the large density of states at the edges and may participate to the fragility of topological edge states by causing additional scattering.
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