Transmission Electron Microscopy

Abstract This chapter presents from a practical standpoint how images and diffraction data given by transmission electron microscopy (TEM) imaging and electron diffraction techniques are well adapted crystallographic tools to the characterization of carbon materials. The key parameters for TEM observations, their limitations, possible errors and remedies are discussed. Various modes of TEM are described: contrasted bright field, hkl dark fields, 002 lattice fringes and selected area electron diffraction. The data given by TEM techniques allow precise description of amorphous, turbostratic (2D order), graphitized (3D order), partly graphitized, nongraphitized carbons, as well as graphite, disordered carbons. Examples of application of TEM techniques are given through the description of events occurring during primary and secondary carbonization and graphitization. These TEM techniques are useful tools to help to understand the properties and performance of carbon materials.