Recent results from tests of fast analog-to-digital converters

We present results from tests of eight, ten, and twelve bit ADCs that operate in the range of 10 to 120 megasamples per second. We use a test bench and software we have developed to perform the tests on as wide a range of devices as possible. By testing devices with the same input signals, the same software, and the same parameter definitions, we make possible direct comparisons between competing devices. Important parameters measured include integral and differential nonlinearity, effective number of bits, and word error rate. While the tests are intended primarily to benefit the design of high rate physics experiments, the results are also useful to workers in other fields. >