Development of a high-temperature (295–900 K) Seebeck coefficient Standard Reference Material

We report the development of a high-temperature Seebeck coefficient Standard Reference Material (SRM) for use in instrument validation and interlaboratory data comparison in the temperature range of 295–900 K to support the research, development, and production of materials and devices related to thermoelectric-based energy conversion applications. We describe the synthesis, anneal–quench procedure, and physical characterization of a p-type boron-doped polycrystalline silicon–germanium alloy with a nominal composition of Si80Ge20. For the certification measurements, we describe the measurement protocols, statistical analysis, the certified Seebeck coefficient values, comprehensive uncertainty budgets, and metrological traceability. Our extensive efforts to identify, reduce, and quantify measurement uncertainties will be emphasized. This new SRM complements SRM 3451 Low-Temperature Seebeck Coefficient Standard (10–390 K) to provide certified reference materials traceable to the International System of Units (SI) for Seebeck coefficient measurements within the temperature range 10–900 K.