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Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
2018
Hannu S. Laine
Henri Vahlman
Antti Haarahiltunen
Mallory A. Jensen
Chiara Modanese
Matthias Wagner
Franziska Wolny
Tonio Buonassisi
Hele Savin
Keywords:
Materials science
Process modeling
light induced
degradation kinetics
Optoelectronics
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