Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit

A radiation hardened flip-flop immune to soft errors is proposed which is based on robust differential input latches working on single-phase clock. The proposed circuit is implemented in 90nm ST BCD process and is found to have lower power consumption and better robustness with respect to state of art architectures. Experimental results are based on CAD analysis and two test-chips implemented in 90nm BCD process, of which the former is dedicated to radiation characterization and the latter to actual application. Both test-chips are exposed to alpha particles source to see the impact of particle strike on the flip-flops.