Numerical investigation of the unified model of stacked Josephson junctions

We study numerically the dynamics of multistacked Josephson junctions using the unified model of Machida and Sakai. This model takes into account simultaneously the inductive and the capacitive coupling between junctions. The influence of the capacitive coupling on the fluxon dynamics is analyzed and a comparison with the case of only inductive coupling is made. The corresponding system of perturbed sine-Gordon equations is solved numerically by finite difference methods. Different physical quantities that can be measured in real experiments are numerically calculated.