Pd-C film growN ON SiO 2 /Si and Si substrates
2010
In this paper we present results of SEM, XRD and EXAFS studies of palladium-carbon nanostructural films prepared in two-steps method on pure and oxidized silicon substrates. Structural, topographical and morphological differences were found between films deposited on those substrates.
Keywords:
-
Correction
-
Source
-
Cite
-
Save
2
References
0
Citations
NaN
KQI