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Detailed Design and RF Analysis of a Scatterometer for Material Characterization in the 50-750 GHz Range
Detailed Design and RF Analysis of a Scatterometer for Material Characterization in the 50-750 GHz Range
2018
Cecilia Cappellin
Per Heighwood Nielsen
R. Appleby
Richard J. Wylde
E. Saenz
Keywords:
Scatterometer
Electronic engineering
Engineering
Optics
Remote sensing
Correction
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