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Development of a beam profile monitor based on silicon strip sensors for low-charge electron beams
Development of a beam profile monitor based on silicon strip sensors for low-charge electron beams
2020
S Jaster-Merz
R.W. Assmann
F. Burkart
U. Dorda
Jan Dreyling-Eschweiler
L. Huth
U. Kramer
M. Stanitzki
Keywords:
Charge (physics)
Optoelectronics
Materials science
Silicon
development
Beam (structure)
Electron
Correction
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