Triple-view line confocal and structured illumination microscopy

The modern fluorescence microscope would ideally offer high spatial resolution in all dimensions, high speed and minimal photodamage to specimens. We developed a triple-view line confocal system that improves spatial resolution in all three dimensions (to ~270 nm x 250 nm x 335 nm or ~185 nm x 170 nm x 245 nm with structured illumination) in scattering samples tens of microns thick. To speed up acquisition and reduce photobleaching, deep learning is applied to denoise and enhance resolution when only using data acquired from one view.