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C-12-4 Modeling of Chip Surface Magnetic Field for Active Probe Scanning System
C-12-4 Modeling of Chip Surface Magnetic Field for Active Probe Scanning System
2013
Nan Takeuchi
Tetsuya Yoshikawa
Kunihiro Nagata
Keywords:
Chip
Magnetic field
Scanning capacitance microscopy
Scanning Hall probe microscope
Nuclear magnetic resonance
Analytical chemistry
Materials science
Optoelectronics
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