Characterization of an UO2 ceramic via Raman imaging and electron back-scattering diffraction

Abstract A surface state analysis of an UO 2 ceramic is performed by combining Raman imaging and electron back-scattering diffraction. Special attention is paid to the behavior of the T 2g band intensity versus the crystalline orientation. In order to clarify the origin of the T 2g intensity variation in the appropriate Raman image, electron back-scattering diffraction (EBSD) measurements are carried out. EBSD data allow a theoretical estimation of the Raman T 2g band intensities. Both maps have been compared in order to correlate them, and to distinguish regions where they are analogous, from those where some physical or chemical effects (stoichiometry, or strains) induce different behavior. More generally, this highlights the interest and the complementarity of combining Raman spectroscopy and EBSD for a better microstructure knowledge.