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Single event effects induced by heavy ions in SONOS charge trapping memory arrays
Single event effects induced by heavy ions in SONOS charge trapping memory arrays
2021
T. Patrick Xiao
Christopher H. Bennett
Sapan Agarwal
David Russell Hughart
Hugh J. Barnaby
Helmut Puchner
A. Alec Talin
Matthew J. Marinella
Keywords:
Atomic physics
Trapping
event
Ion
Charge (physics)
Physics
Correction
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