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An Analysis of Presolar SiC X Grains and Mainstream Grains Using Transmission Electron Microscopy
An Analysis of Presolar SiC X Grains and Mainstream Grains Using Transmission Electron Microscopy
2009
K. M. Hynes
Sachiko Amari
T.K. Croat
A. F. Mertz
T. J. Bernatowicz
Keywords:
Optoelectronics
Transmission electron microscopy
Materials science
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