Calculation of pile-up effects in X-ray detection with large area circular silicon drift detectors

Abstract A Monte Carlo simulation of pile-up effects, in X-ray detection with large area Circular Silicon Drift Detectors (CSDDs), is presented. Four parameters, strongly influencing the counting capability of a CSDD, are taken into account. Namely, the correlation of incoming X-ray flux, detector area, signal induced on sensing electrode, and front end analog electronics response function is studied and pile-up probabilities are calculated.