Characterization of Materials in the 50–750 GHz Range Using a Scatterometer

In this work we describe the design and operation of a scatterometer to be used at the European Space Agency. The instrument has the purpose to characterize smooth as well as rough materials, in transmission and reflection in the 50–750 GHz frequency range. We first discuss some of the design challenges encountered during the design, and later show some of the initial measured results.