Crystal growth of BaAgAs family topological materials via flux method

Abstract BaAgAs and its family materials MRPn (M=Ca, Sr, Ba, R=Ag, Au, Pn=As, Bi) were theoretically predicted to hold various topological phases. In this paper, the growth method of MRPn family materials was investigated and single crystals were successfully obtained by flux method. The crystal composition was confirmed by the energy dispersive X-ray spectroscopy (EDS). Crystal structure and surface planes were examined by X-ray diffraction (XRD). Temperature-dependent resistivity measurements from 2.5 K to 300 K reveal that all the samples are metallic.